Manual X-Axis Stages Cross Roller

Semiconductor chip testing has relatively high requirements for precision. This translation stage has a tabletop size of 80×80 mm, which can hold small chips; the crossed roller guideway ensures smooth sliding, while the micrometer drive device enables precise position adjustment. Its surface is treated with black anodization, providing rust and corrosion resistance. In addition, the translation stage has a load-bearing capacity of 98 Newtons, which can stably support the chip and facilitate testing equipment to conduct accurate detection on the chip.