Semiconductor chip inspection has extremely high requirements for precision. This stage is made of aluminum alloy, which boasts excellent stability and can reduce external interference. Driven by a micrometer, the stage enables micron-level adjustment; its 360° rotation function allows for comprehensive inspection of the circuits on the chip surface, while the ±5° fine adjustment can accurately locate chip defects. It assists inspectors in screening qualified chips, ensures the quality of semiconductor products, and promotes the high-quality development of the semiconductor industry.